Four Point Probe Resistivity Measurements
Automatic Four Point Probe
The Multiheight Probe station with an automatic Z motion (AFPP) for use in carrying out four point probe measurements. The AFPP handles the measurement of a wide variety of samples from small sized thin layers and 300mm wafers up to
Multiposition Wafer Probe
The probe is proposed in two sizes at the same cost. The first size is for wafers up to 150mm diameter and the second for wafers up to 200mm diameter. If small sized wafers are to be measured the smaller
Multi Height Four Point Probe
It is composed of a hard anodised aluminium base 250mm wide, 290mm deep and 8mm thick. A column of stainless steel with a 19mm diameter and a height of 200mm secured to the base supports the probe head up and
Universal Probe Station
Very repeatable needle contact conditions. Customized needle loadings which directly indicate the set load. Micrometer controlled slice displacement. Four-point measurement of wafer resistivity and measurements of three-point spreading resistance. Hinged steel cover to exclude effects of light and eliminate electrical
Multiheight Microposition Probe Stand
The Multiheight Probe stand with micrometer controlled X-Y allows to measure sample sizes from several mm square up to 300mm. The X-Y microposition table can be easily added when measurement of small samples is needed. With only four screws to
RM3000 Test Unit
For use in making four point probe measurements. The RM3000 can supply constant currents between 10nA and 99.99mA, and measure voltages from 0.01mV to 1250mV. For sheet resistance measurements the quoted range is 1 milliohm/square to 5 x 108 ohms/square.
ResTest Meter
A specialty electronics instrument designed specifically for the four point probe measurement. It features high accuracy, an excellent range, and many features which simplify the four point probing measurement. About the Jandel ResTest Four Point Probe Constant current source and
HM21 Portable Four Point Probe Test Meter
HM21 for use in making four point probe measurements. The HM21 has six constant current settings between 100nA and 10mA, and measures voltages from 0.01mV to 1250mV. For sheet resistance measurements the quoted range is 1 ohm/square to 10 Megohms/square.
Cylindrical Four Point Probe Head
Jandel Engineering Limited manufactures the cylindrical four point probe head to be compatible with the Jandel Multiposition Wafer Probe, the Microposition Probe, the Multiheight Probe, The Multiheight/Microposition Probe, as well as some OEM mapping systems. It can be built into
Hand Applied Four Point Probe
A solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots. The probe head can have loads of up
Compact Probe Head
For use on Veeco FPP50000 and FPP100 equipment. It is also suitable for use on GRQ equipment or to replace square bodied probe heads manufactured by Alessi. Some Veeco equipment requires a differently shaped probe (cartridge with lead). Please let
Probes for Prometrix CDE
Manufactured with 6-way connector probe head to be compatible with systems manufactured by CDE, Creative Design Engineering. All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection
Miniature Catridge Probe Head with Positioning Key
Manufactured with positioning key for use on older Napson and Kokusai equipment. All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads
Cartridge probe with 6-way connector (KLA/Tencor)
All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by electronic force gauge. Each probe has upper and lower
Miniature Catridge Probe with 6-32/M3 Mounting Holes
This probe is very similar to the miniature cartridge probe with mounting key for use on older Napson equipment or Kokusai equipment and care should be taken not to confuse the two. If in doubt please contact us. All Jandel
Catridge with lead Probe Head
For use on customer ’s own equipment, some Veeco equipment, or where an A&M Fell style probe has previously been used. Some Veeco equipment requires a differently shaped probe (Compact Probe). Please let us know if you are unsure which
Catridge Probe With 4-Pin Connector Mounting
For use on Napson equipment or older Keithley-Omega equipment. All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads are verified by
Low Profile Probe for Hall Measurements
For use in making four point probe measurements associated with Hall measurements. All Jandel probes are built to a high level of mechanical accuracy. Specifications for radii, spacing and planarity are verified by video inspection system and optical interferometer. Loads
Macor Probe
For use at high or low temperatures. The range the probe can be used in an oven is approximately 80K to 600K. If the sample only is heated the probe can be used for measurements up to 1000K although prolonged
Hi-Vac Cylindrical Four Point Probe Head
A version of the cylindrical probe which can be used at high vacuum. The probe is unanodised and has had blind holes removed where possible. High vacuum wire is used for the connections which are crimped rather than soldered. A
CMT-SR2000N
CMT SR – 2000 N Semi-Automated Sheet Resistance and Resistivity Measurement System. The entry-level model of the AIT four point measuring systems family. The unit features an automatic contact system. Measurement range (current) isautomatic or manual. The support allows measurements
CMT-SR3000
Sheet Resistance & Resistivity Measuring System (Four Point Probe System for Glass). This system, developed by the technical joint of Korea Research Institute of Standards and Science(KRISS)” and “Advanced Instrument Technology(A.I.T)”, is indispensable in semiconductor manufacturing process. Feature: • Measures
CMT-SR2000PV
The CMT SR2000 is a completely automated, mapping four point measuring system. It offers precise and fiable mapping measurements of resistivity and sheet resistance. The unit exists in two versions. N version allows the measurement of round wafers up to
Miniature Catridge Four Point Probe Head
FEATURE 1. Anodized aluminum alloy upper and lower guides are jeweled.2. Solid tungsten carbide needles for superior durability.3. Teflon insulation gives minimum leakage4. Loads checked by electronic force gauge5. Spacing and tip radii optically checked for accuracy byinterferometer. PROPER CHOICE