A solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots.
The probe head can have loads of up to 200g per needle and the Hand Applied Probe has a large downward force of around 1.2Kg and so is not suitable for fragile unsupported samples. As a scale for size the main image above shows the Hand Applied Probe sitting on top of a 150mm silicon ingot.