Automatic Four Point Probe

The Multiheight Probe station with an automatic Z motion (AFPP) for use in carrying out four point probe measurements.

The AFPP handles the measurement of a wide variety of samples from small sized thin layers and 300mm wafers up to ingots 250mm high (thicker samples can be accommodated if needed). The AFPP can be operated stand alone with a supplied power adapter, or can be powered and controlled by the Jandel RM3000 using a single lead connection between the two devices.