CMT SR – 2000 N Semi-Automated Sheet Resistance and Resistivity Measurement System. The entry-level model of the AIT four point measuring systems family.
The unit features an automatic contact system. Measurement range (current) isautomatic or manual. The support allows measurements of wafers up to 8’’ (200mm).The AIT software is included, allowing the download of the data. Speed ofmeasurement is approximately 3 seconds per point.Electrical accuracy is 0.5% for V/I of 5mΩ to 10KΩ at an ambient temperature of23. The measurement range goes from 1mΩ/sq to 2MΩ/sq (Resistivity :10µohm.cm to 200Kohm.cm)Automatized mapping of the wafer is NOT possible with this model.The JANDEL Probe Head, one of which is provided with the MultiHeight Station, canbe completely customized following the user’s needs (tip radius, spacing, tipsarrangement and load).