It is composed of a hard anodised aluminium base 250mm wide, 290mm deep and 8mm thick. A column of stainless steel with a 19mm diameter and a height of 200mm secured to the base supports the probe head up and down mechanism which incorporates the vertical slide, and operates lever shaft, and micro-switch. The vertical slide carries the probe-head, secured by a clamp screw. The probe-head is fixed so that the micro-switch does not send current until the contact between the probes is established. Lost motion switches the current off before the probes are raised. The probe arm is very flexible on the vertical shaft, being addapted to various heights in order to allow probing onto either flat, large or thick materials. For example, a thermal chuck or a shallow dish containing LN2 could be fixed on the base plate and the arm could be customized to allow the probe to be lowered onto a sample either submerged in liquid nitrogen or placed upon the heated stage. The Multi Height probe can facilitate the measurement of wafers or larger materials up to 10″ x 10″ (or with a 12″ x 12″ working area for the same price), ingots, and materials that are up to 6″ in height. A longer post option allows the measurements of even taller materials. The Multi Height Probe includes one Cylindrical probe head.